Moving Test Data Faster

Increasingly complex chip designs require more test data than those developed at older nodes and on single planar dies. The challenge is moving all of that data through the system without slowing down the testing processes. Vidya Neerkundar, director of DFT product management for Siemens EDA’s Tessent Division, talks about the different test options, which ones work best where, and how different standards impact the test process.

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