Semiconductor Engineering
Accelerating Shift Left With Early RTL DFT Analysis And Connectivity Verification
How to address the critical challenge RTL designers face: identifying testability issues late in the design cycle, leading to costly re-spins and schedule delays. This white paper demonstrates how early RTL testability analysis and Design-for-Test (DFT) optimization enable shift left strategies that improve manufacturing test quality, reduce turnaround time, and deliver early quality estimates—all essential for managing growing design complexity and shrinking development cycles.
What You’ll Learn:
- Identify DFT violations at RTL to ensure scan readiness and accelerate time-to-DFT implementation
- Estimate ATPG coverage early with proven correlation within 1% for stuck-at and 5% for transition delay faults
- Detect clock domain glitches and test robustness issues before synthesis to prevent timing violations
- Optimize test point selection using hard-to-detect fault analysis to reduce pattern count and test costs
- Validate DFT connectivity across SoC hierarchies with design-agnostic structural checks
Read more here.
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